吉河教授が筆頭/責任著者の論文が学術雑誌Springer, Journal of Electronic Testing より発行されました。
Takefumi Yoshikawa, Masahiro Ishimaru, Tatsuya Iwata, Fuma Mori, Kazutoshi Kobayashi, "A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment," Journal of Electronic Testing, Volume 37, Issue 4, Jan. 2022. DOI: https://doi.org/10.1007/s10836-021-05972-y